New mechanism for impurity-induced step bunching
نویسنده
چکیده
– Codeposition of impurities during the growth of a vicinal surface leads to an impurity concentration gradient on the terraces, which induces corresponding gradients in the mobility and the chemical potential of the adatoms. Here it is shown that the two types of gradients have opposing effects on the stability of the surface: Step bunching can be caused by impurities which either lower the adatom mobility, or increase the adatom chemical potential. In particular, impurities acting as random barriers (without affecting the adatom binding) cause step bunching, while for impurities acting as random traps the combination of the two effects reduces to a modification of the attachment boundary conditions at the steps. In this case attachment to descending steps, and thus step bunching, is favored if the impurities bind adatoms more weakly than the substrate. Introduction. Step bunching is a morphological instability of a vicinal crystal surface, in which a regular train of equally spaced steps separates into regions of high step density – the step bunches – and large flat terraces. The process can be driven energetically by an attractive step-step interaction, or by a variety of kinetic mechanisms, which all share the common feature of breaking the symmetry between the ascending (upper) and descending (lower) step bordering the vicinal terrace [1]. In growth or sublimation, the symmetry breaking is provided by the different kinetic rates for the attachment and detachment of adatoms [2] (or some other species required for growth [3]) at the upper and the lower step; step bunching occurs under growth if atoms attach preferentially to the descending step. For electromigration-induced step bunching, the asymmetry is introduced by the electric field, and the step train is unstable if the adatom motion is biased in the down-step direction [4]. It has been appreciated for a long time that in many cases step bunching must be attributed to the presence of impurities [5]. The traditional view is that impurities pin the steps [6]. Once a step is slowed down relative to its neighbors, more impurities accumulate in front of it and delay it even further, leading to a feedback mechanism which drives the instability [7]. A different kind of impurity-mediated step bunching was suggested in recent work on Si1−yCy layers grown on Si(100) by molecular beam epitaxy, in which C plays the role of a codeposited impurity [8]. The key observation is that different parts of the vicinal terrace have been exposed to the impurity flux for different durations. Therefore the impurity concentration is smallest on the freshly created part near the descending step, and largest near the ascending
منابع مشابه
Current-Induced Step Bending Instability on Vicinal Surfaces
Motivated by recent experiments on current induced step bunching on Si(111) surfaces, we study a generalized 2D Barton-Cabrera-Franck model, where adatoms have a diffusion bias parallel to the step edges and there is an attachment barrier at the step edge. We find a new linear instability with novel step patterns. Monte Carlo simulations on a solid-on-solid model are used to study the instabili...
متن کاملInstabilities of Vicinal Silicon ( 111 ) Surfaces
The morphological instabilities of vicinal Si(111) due to a DC electric current and due to the 7 x 7 reconstruction are studied using a variety of diffraction and imaging techniques. The current induced instabilities which occur at sublimation temperatures or under conditions of step-flow produce morphological features on length scales appropriate for optical studies, 5 50,u. Optical microscopy...
متن کاملDrift-Induced Step Instabilities Due to the Gap in the Diffusion Coefficient
Masahide Sato,∗ Makio Uwaha, and Yukio Saito Information Media Center of Kanazawa University, Kakuma-cho, Kanazawa 920-1192, Japan Department of Physics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8602, Japan Department of Physics, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan (Dated: April 28, 2004) Abstract On a Si(111) vicinal face near the structural transiti...
متن کاملDimer diffusion as a driving mechanism of the step bunching instability during homoepitaxial growth
متن کامل
Convective instability of strained layer step-flow
We examine an epitaxial crystal growth model in the context of absolute and convective instabilities and show that a strain-induced step bunching instability can be convective. Using analytic stability theory and numerical simulations, we study the response of the crystal surface to an inhomogeneous deposition flux that launches impulsive and time-periodic perturbations to a uniform array of st...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2002